Mrozek, Ireneusz
Multi-run Memory Tests for Pattern Sensitive Faults
Springer Cham, 2019
eBooks
City of bits
Buku Teks
Computational Photonic Sensors
Springer Cham, 2019
eBooks
Ryder, John D. (John Douglas)
Engineering electronics
McGraw-Hill, [date of publication not identified]
Buku Teks
Dedy Rusmadi
Mengenal teknik digital
Sinar Baru , 1989
Buku Teks