Ditemukan 33 dokumen yang sesuai dengan query
Villanucci, Robert S.
Englewood Cliffs, NJ: Prentice-Hall, 1982
621.381 5 VIL e
Buku Teks Universitas Indonesia Library
Boylestad, Robert L.
"
Electronic Devices and Circuit Theory, Eleventh Edition, offers a complete, comprehensive survey, focusing on all the essentials you will need to succeed on the job. Setting the standard for nearly 30 years, this highly accurate text is supported by strong pedagogy and content that is ideal for new students of this rapidly changing field. The colorful layout with ample photographs and examples helps you better understand important topics. This text is an excellent reference work ...
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Upper Saddle River, N.J: Pearson Prentice Hall, 2013
621.381 5 BOY e
Buku Teks Universitas Indonesia Library
"
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results ...
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Materials Park, Ohio: ASM International, 2010
e20451716
eBooks Universitas Indonesia Library
Retno Widayati
"
Jasper Jumper is an orthodontic appliance that belongs to fixed functional appliance. This appliance is designed to correct class II malocclusion case, and also further development of Herbst's. Jasper Jumper can be used to move a tooth, a group of teeth, or the entire denture. In addition, this appliance can produce the same effect as headgear, activator, or any combination of them. Understanding of selected cases, biomechanics and the working mechanism of Jasper Jumper is ...
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Jakarta: Journal of Dentistry Indonesia, 2004
AJ-Pdf
Artikel Jurnal Universitas Indonesia Library
New York: McGraw-Hill, 1976
643.6 SMA
Buku Teks Universitas Indonesia Library
Schwarz, A.F.
London: Academic Press, 1987
621.381 SCH c II
Buku Teks Universitas Indonesia Library
Villanucci, Robert S.
Englewood Cliffs, NJ: Prentice-Hall, 1981
621.381 VIL e
Buku Teks Universitas Indonesia Library
"
Contents :
- A Comparitive Study of Electron and Ion Beam Induced Charge Imaging
Techniques in CMOS Failure Analysis
- Infrared Light Emission From Semiconductor Devices
- The Use of Near-Field Scanning Optical Microscopy for Failure Analysis of ULSI
Circuits
- Golden Devices II: Alchemy in the 0.35 um Era
- Focused Ion Beam Assisted Circuit Debug of a Video Graphics Chip
- Two ...
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Materials Park, Ohio: ASM International, 1996
e20442490
eBooks Universitas Indonesia Library
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In this paper we present a new method to increase the lateral resolution available in laser scanning failure analysis tools. By fabricating a diffractive lens on the back side of the die, the area of the circuit of interest, directly underneath the lens, may be studied with a lateral resolution up to 3.5 times better than without the lens. This method is easily implemented with standard equipment already present in most failure analysis laboratories, and ...
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Materials Park, Ohio: ASM International, 2005
e20442491
eBooks Universitas Indonesia Library
Morgan, David
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This major reference book is aimed at engineers and technical managers concerned with EMC (electromagnetic compatibility). It explains why EMC testing is necessary, what standards must be met, how such testing is carried out (and therefore how to prepare for it), what accuracy and repeatability can be expected, and when to test. For less than the cost of half a day's testing in a laboratory, with this book manufacturers of equipment can prepare for and ...
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London: International Engineering Consortium, 2007
e20452027
eBooks Universitas Indonesia Library
