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Ditemukan 4 dokumen yang sesuai dengan query
cover
Badavas, Paul C.
Englewood Cliffs, NJ: Prentice-Hall, [Date of publication not identified]
658.562 BAB r
Buku Teks  Universitas Indonesia Library
cover
Keller, Paul
New York: McGraw-Hill, 2011
658.562 KEL s
Buku Teks  Universitas Indonesia Library
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Mason,Robert L., 1946-
Abstrak :
This applied, self-contained text provides detailed coverage of the practical aspects of multivariate statistical process control (MVSPC)based on the application of Hotelling's T2 statistic. MVSPC is the application of multivariate statistical techniques to improve the quality and productivity of an industrial process. The authors, leading researchers in this area who have developed major software for this type of charting procedure, provide valuable insight into the T2 statistic. Intentionally including only a minimal amount of theory, they lead readers through the construction and monitoring phases of the T2 control statistic using numerous industrial examples taken primarily from the chemical and power industries. These examples are applied to the construction of historical data sets to serve as a point of reference for the control procedure and are also applied to the monitoring phase, where emphasis is placed on signal location and interpretation in terms of the process variables.
Philadelphia : Society for Industrial and Applied Mathematics, 2002
e20442739
eBooks  Universitas Indonesia Library
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Czitrom, Veronica
Abstrak :
This book contains a broad selection of case studies written by professionals in the semiconductor industry that illustrate the use of statistical methods to improve manufacturing processes. These case studies offer engineers, scientists, technicians, and managers numerous examples of best-in-class practices by their peers. Because of the universal nature of statistical applications, the methods described here can be applied to a wide range of industries, including the chemical, biotechnology, automotive, steel, plastics, textile, and food industries. Many industries already benefit from the use of statistical methods, although the semiconductor industry is considered both a leader in and a model for the wide application and effective use of statistics. Specific case studies address the following statistical methods: gauge studies, passive data collection (sources of variation studies), design of experiments, statistical process control, and equipment reliability. Readers familiar with the statistical methodologies that comprise the Six Sigma tool box will find a wealth of applications. Czitrom has written an introduction to each statistical method, which, along with a glossary, gives basic definitions of frequently occurring statistical terms and suggestions for further reading. The case studies, which can be used in industrial training as well as in academia, are an extremely useful classroom supplement and will remain a rich source of used and useful approaches to real industrial problems for years to come. All of the data sets for each case study are available online.
Philadelphia: Society for Industrial and Applied Mathematics, 1997
e20448515
eBooks  Universitas Indonesia Library