Ditemukan 134 dokumen yang sesuai dengan query
Kraus, John D. (John Daniel)
New York: McGraw-Hill, 1992
530.141 KRA e
Buku Teks SO Universitas Indonesia Library
Kraus, John D. (John Daniel)
New York: McGraw-Hill, 1973
530.141 KRA e
Buku Teks SO Universitas Indonesia Library
Engineering electromagnetics
Auckland: MCGraw-Hill, 1981
530.141 HAY e
Buku Teks SO Universitas Indonesia Library
Kraus, John D. (John Daniel)
Auckland: McGraw-Hill, 1984
530.141 KRA e
Buku Teks SO Universitas Indonesia Library
Hayt, William H.
Auckland: McGraw-Hill, 1981
530.141 HAY e
Buku Teks SO Universitas Indonesia Library
Hammond, P. (Percy)
Oxford: Pergamon Press, 1985
537 HAM a (1)
Buku Teks SO Universitas Indonesia Library
Hayt, William H.
Jakarta: Erlangga, 2006
530HAYE001
Multimedia Universitas Indonesia Library
Garg, Ramesh
"Electromagnetics principles are the essential background that engineers need to get the most out of powerful computational tools and commercial software for optimizing microwave system performance. This title offers the analytical fundamentals needed to understand the most important methods in the field. "
Boston: Artech House, 2008
621GARA001
Multimedia Universitas Indonesia Library
Liu, Taikang
"This book presents a model of electromagnetic (EM) information leakage based on electromagnetic and information theory. It discusses anti-leakage, anti-interception and anti-reconstruction technologies from the perspectives of both computer science and electrical engineering. In the next five years, the threat posed by EM information leakage will only become greater, and the demand for protection will correspondingly increase.The book systematically introduces readers to the theory of EM information leakage and the latest technologies and measures designed to counter it, and puts forward an EM information leakage model that has established the foundation for new research in this area, paving the way for new technologies to counter EM information leakage. As such, it offers a valuable reference guide for all researchers and engineers involved in EM information leakage and countermeasures."
Singapore: Springer Nature, 2019
e20508043
eBooks Universitas Indonesia Library
Zahn, Markus
New York : John Wiley & Sons, 1979
530.141 ZAH e (1);530.141 ZAH e (2)
Buku Teks SO Universitas Indonesia Library