Ditemukan 81 dokumen yang sesuai dengan query
Morgan, David, author
This major reference book is aimed at engineers and technical managers concerned with EMC (electromagnetic compatibility). It explains why EMC testing is necessary, what standards must be met, how such testing is carried out (and therefore how to prepare for it), what accuracy and repeatability can be expected, and when...
London: International Engineering Consortium, 2007
e20452027
eBooks Universitas Indonesia Library
Lenk, John D., author
New York: McGraw-Hill, 1993
R 621.38 LEN m
Buku Referensi Universitas Indonesia Library
New York: McGraw-Hill, 1977
R 621.381 ELE (1)
Buku Referensi Universitas Indonesia Library
Rybin, Yu. K., author
Electronic Devices for Analog Signal Processing is intended for engineers and post graduates and considers electronic devices applied to process analog signals in instrument making, automation, measurements, and other branches of technology. They perform various transformations of electrical signals : scaling, integration, logarithming, etc.
The main goal of Electronic Devices...
Dordrecht : [Springer Science, ], 2012
e20398226
eBooks Universitas Indonesia Library
Small molecules and conjugated polymers, the two main types of organic materials used for optoelectronic and photonic devices, can be used in a number of applications including organic light-emitting diodes, photovoltaic devices, photorefractive devices and waveguides. Organic materials are attractive due to their low cost, the possibility of their deposition...
Cambridge, UK: Woodhead, 2013
e20427108
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks Universitas Indonesia Library
Contents :
- Microelectronics failure analysis desk reference, 2001 supplement
- Preface
- Microelectronic Failure Analysis Desk Reference 2001 Supplement
- FIB Backside Isolation Techniques
- The SEM Lab, From Laboratory Logistics to Final Sample Preparation
Techniques for SEM Analysis of Semiconductors
- Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks Universitas Indonesia Library
Contents
- IPFA 2000 Best Paper Award Winner
- Application of Focused Ion Beam System as a Defect Localization and Root
Cause Analysis Tool
- Session 1: Advanced Techniques 1
- X-Ray Tomography of Integrated Circuit Interconnects: Past and Future
- X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
