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"In this paper we estimate the stress-strength reliability of a parallel system with I active components, s warm standby components, and k cold standby components. We assume perfect switching among the components from warm standby mode to active mode and from cold standby mode to warm standby mode. A reduced stress for the warm standby components is introduced and the components may fail in the warm standby mode. The reliability of the parallel system is evaluated by assuming the stress and strength of the components to be independent random variables. We derive the expression of reliability of the system by assuming both the stress and strength of the components having Exponential, Weibull, and Lomax distributions, respectively. The method of maximum likelihood estimation is used to obtain the reliability estimators. Illustrations are provided through an example using MATLAB programming."

"Recent advances in system reliability discusses developments in modern reliability theory such as signatures, multi-state systems and statistical inference. It describes the latest achievements in these fields, and covers the application of these achievements to reliability engineering practice. The chapters cover a wide range of new theoretical subjects and have been written by leading experts in reliability theory and its applications. The topics include, concepts and different definitions of signatures (D-spectra), their properties and applications to reliability of coherent systems and network-type structures, Lz-transform of Markov stochastic process and its application to multi-state system reliability analysis, methods for cost-reliability and cost-availability analysis of multi-state systems, optimal replacement and protection strategy, and statistical inference.Recent advances in system reliability presents many examples to illustrate the theoretical results. Real world multi-state systems, such as power generation and transmission, refrigeration, and production systems, are considered in the form of case studies."

"Engineering reliability concerns failure data analysis, the economics of maintenance policies, and system reliability. This textbook develops the use of probability and statistics in engineering reliability and maintenance problems. The author uses probability models in the analysis of failure data, decision relative to planned maintenance, and prediction relative to preliminary design."

"This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes-all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.- Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications;- Explains the fundamentals of reliability physics and engineering tools for building better products;- Contains statistical training and tools within the text;- Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation."