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"In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate interface phenomena and the principles that govern them."

"The book begins by identifying the components of a general image registration system, and then describes the design of each component using various image analysis tools. The text reviews a vast array of tools and methods, not only describing the principles behind each tool and method, but also measuring and comparing their performances using synthetic and real data."