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"The book discusses active devices and circuits for microwave communications. It begins with the basics of device physics and then explores the design of microwave communication systems including analysis and the implementation of different circuits. In addition to classic topics in microwave active devices, such as p-i-n diodes, Schottky diodes, step recovery diodes, BJT, HBT, MESFET, HFET, and various microwave circuits like switch, phase shifter, attenuator, detector, amplifier, multiplier and mixer, the book also covers modern areas such as Class-F power amplifiers, direct frequency modulators, linearizers, and equalizers. Most of the examples are based on practical devices available in commercial markets and the circuits presented are operational. The book uses analytical methods to derive values of circuit components without the need for any circuit design tools, in order to explain the theory of the circuits. All the given analytical expressions are also cross verified using commercially available microwave circuit design tools, and each chapter includes relevant diagrams and solved problems. It is intended for scholars in the field of electronics and communication engineering."

"This textbook provides an in-depth treatment of the physics of power semiconductor devices that are commonly used by the power electronics industry. Drawing upon decades of industry and teaching experience and using numerous examples and illustrative applications, the author discusses in detail the various device performance attributes that allow practicing engineers to develop energy-efficient products. Coverage includes all types of power rectifiers and transistors and analytical models for explaining the operation of all power semiconductor devices are developed and demonstrated in each section of the book. Throughout the book, emphasis is placed on deriving simple analytical expressions that describe the underlying physics and enable representation of the device electrical characteristics. This treatment is invaluable for teaching a course on power devices because it allows the operating principles and concepts to be conveyed with quantitative analysis. The treatment focuses on silicon devices but includes the unique attributes and design requirements for emerging silicon carbide devices. This new edition also includes a chapter on the impact of power semiconductor devices on energy savings and reduction of carbon emissions."

"This book offers a concise introduction to the analysis of electrical transients aimed at students who have completed introductory circuits and freshman calculus courses. While it is written under the assumption that these students are encountering transient electrical circuits for the first time, the mathematical and physical theory is not ‘watered-down.’ That is, the analysis of both lumped and continuous (transmission line) parameter circuits is performed with the use of differential equations (both ordinary and partial) in the time domain, and the Laplace transform. The transform is fully developed in the book for readers who are not assumed to have seen it before. The use of singular time functions (unit step and impulse) is addressed and illustrated through detailed examples.The appearance of paradoxical circuit situations, often ignored in many textbooks (because they are, perhaps, considered ‘difficult’ to explain) is fully embraced as an opportunity to challenge students. In addition, historical commentary is included throughout the book, to combat the misconception that the material in engineering textbooks was found engraved on Biblical stones, rather than painstakingly discovered by people of genius who often went down many wrong paths before finding the right one. MATLAB® is used throughout the book, with simple codes to quickly and easily generate transient response curves."

"This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing."